Multiple test modes
R/R-T/T/LPR/LPR-T four modes can be selected, LPR is a low-voltage test mode, can effectively protect the DUT
Multi-channel measurement
The built-in comparator gears allow the setting of 6 comparison results. The component under test can be divided into 7 bins (BIN1, BIN2, BIN3, BIN4, BIN5, BIN6 and NG).
Logging and statistics
Logging: Up to 10000 groups of data can be recorded;
Statistics: up to 10,000 sets of data, process capability index calculation possible
Temperature correction and conversion
Temperature correction: Compensates for deviations in measured values due to temperature.
Temperature conversion: The difference between the internal temperature of the DUT and the ambient temperature can be obtained through the thermal effect of the resistor.

Need Help?
We are here!

Download Brochure
